Instrumentation for High-Resolution Microscopy & Imaging

  • Focused Ion Beam (FIB)

    ThermoFisher Helios 5 CX Duel Beam

    • Type of Ion Source: Ga

    • Type of Electron Gun: Field Emission Gun

    • Type of GIS: Pt / W

    • Retractable detector: ABS / CBS

    • Retractable STEM detector

    • Equipped with EDS

    Detail

  • Atom Probe Tomography (APT)

    Cameca Leap 5000

    • Local electrode technology

    • Quantitative 3D compositional imaging and analysis

    • Nanoscale resolution and ppm sensitivity

    • Available in voltage or voltage & laser configurations

    Detail

  • Transmission Electron Microscopy (TEM)

    ThermoFisher Talos F200X

    • TEM Metrology

    • TEM imaging and analysis

    • 3D EDS Tomography

    • Atomic-scale EDS

    • EELS

    • In-situ Experimentation

    Detail

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