Transmission Electron Microscope.
Talos F200X for high resolution TEM and STEM with accurate chemical quantification.
Thermo Scientific Talos F200X for high resoloution TEM and STEM with accurate chemical quantification.
Combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection.
Key Features.
Available with a wide range of high resolution field emissions guns (FEG).
Intuitive software.
Faster time to chemical composition.
Better image data.
Space for more.
High-quality (S)TEM images and accurate EDS.
Highly repeatable data collection.
Increased productivity.
HRTEM at 2nm scale.
(4Co-750C-24h)
TEM-EDS map scan at 100nm scale.
(4Co-750C-6h)
Applications.
Process Control - Process instrumentation for monitoring of key process variables in materials science applications.
Quality Control - Failure analysis and quality control with high-resolution electron microscopy and spectroscopy instrumentation.
Fundamental Materials Research - Materials science research with electron microscopy for the development of novel materials at the micro- and nanoscale.
Semiconductor Pathfinding and Development - Semiconductor analysis and characterization equipment for faster design and fabrication.
Semiconductor Metrology and Yield Analysis - for high-speed, high-resolution, 3D characterization, providing the fastest time to yield.
Semiconductor Failure Analysis - Failure analysis and defect localization for semiconductor devices to achieve higher yield and faster time-to-data.
Semiconductor Device Characterization - Semiconductor imaging, analysis and characterization.
