As a public research and development service platform, Nova Scientific provides failure analysis, sample preparation for high resolution characterization and data processing to material industry.

Many manufacturing companies are facing with a transformation on techniques and products now. A R&D department is essential in this innovation process.

Through analytical microscopy, including Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM) and Atom Probe Tomography (APT), we can characterize the micro structure of material into nanometer scale to know the feature of it.

We use these state of the art high-tech equipment to deliver top level data and analysis service to our clients.

Nova Scientific specializes in analytical microscopy and material testing, with a focus on high resolution characterization techniques.

Our team of international experts enable us to provide efficient and accurate service to help our clients accelerating their research and development of material innovation at affordable cost.