Micro structure characterization.

Thickness of TEM sample should be below 100nm.

Diffraction spot shows 3D crystal structure of material in atomic scale.

(4Co-750C-24h)

Thickness of sample is between 30nm to 70nm.

Morphology characterization of 2D atom arrangement.

Dislocation or twin crystal structure can be observed

(4Co-750C-24h)

Obtain component information and qualitative analysis through X-ray.

Points, line or map element measurement.

Nano scale accuracy.

(4Co-750C-6h)