• Sample preparation for TEM or atom probe tomography (APT).

• Subsurface characterization via cross section imaging (2D) or FIB tomography (3D).

• Nanoscale prototyping.

We use: Helios 5 CX (Ga FIB), Helios 5 UX (Ga FIB), Helios 5 Hydra CX (PFIB).

• High resolution (≤0.10 nm) TEM and STEM imaging, bright field and dark field.

• Diffraction spot characterization.

• Combined with EDS for chemical characterization.

We use: Talos F200i, Spectra 300, Spectra Ultra

• 3D imaging and chemical composition measurements at the atomic scale.

• Equal sensitivity to all elements in the periodic table. and high analytical sensitivity of 5 ppm.

We use: Cameca LEAP 5000 XS, LEAP5 000 XR

• Provide planning and conceptualizing of research projects for academia, or R&D programs for industry.

• Advising on suitable instrumentation & technology for specific analysis and characterization tasks.

• Consolidate and analyze scientific data from imaging or other techniques.

• Data Analysis based on scientific principles, with statistical evaluation. For the shortest time-to-knowledge.

• Collecting and analyzing data to determine the cause of a failure.

• A vital tool used in the development of new products and for the improvement of existing products.

• Using a wide array of methods, especially microscopy.